发明名称 APPARATUS FOR AUTO TESTING RESISTANCE OF PANNEL
摘要 <p>The present invention provides an automatic resistance measurement apparatus of a panel, which can achieve automation of a process by processing resistance measurement of a semiconductor chip embedded in the panel uniformly, and can achieve rapid and safe transportation of the panel, and at the same time can measure resistance of the semiconductor chip efficiently. The automatic resistance measurement apparatus of the present invention includes: a loading part comprising a plurality of stages which supports the panel to be placed on the top and maintains horizontal state of the panel in each process; a resistance measurement part which is inserted with the panel placed on the stage of the loading part and measures resistance of a measurement point as to the semiconductor chip embedded in the panel; an unloading part which settles the panel whose resistance measurement is finished in the resistance measurement part, and discharges the panel by classifying the panel according to pass/fail judgment by the measurement of the resistance measurement part; a transportation part which is formed to pick up the panel in order to transport the panel toward each stage of the loading part and the unloading part according to the process sequence, and then to transport the panel to and fro along an X direction; and a UV printing part which is located at the upper side of the unloading part, and prints a barcode by injecting UV ink to the semiconductor chip of the panel discharged by the unloading part.</p>
申请公布号 KR101480369(B1) 申请公布日期 2015.01.09
申请号 KR20130090361 申请日期 2013.07.30
申请人 SEKWANG TECHNOLOGIES CO., LTD. 发明人 KIM, SUNG MIN;LEE, SEUNG JAE;KIM, KYUNG WON
分类号 G01R27/00;G01R31/28 主分类号 G01R27/00
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