发明名称 |
Semiconductor Device and Method of Forming Through Mold Hole with Alignment and Dimension Control |
摘要 |
A semiconductor device includes a semiconductor die and an encapsulant formed over a first surface of the semiconductor die and around the semiconductor die. A first insulating layer is formed over a second surface of the semiconductor die opposite the first surface. A plurality of conductive vias is formed through the first insulating layer. A conductive pad is formed over the encapsulant. An interconnect structure is formed over the semiconductor die and encapsulant. A first opening is formed in the encapsulant to expose the conductive vias. The conductive vias form a conductive via array. The conductive via array is inspected through the first opening to measure a dimension of the first opening and determine a position of the first opening. The semiconductor device is adjusted based on a position of the conductive via array. A conductive material is formed in the first opening over the conductive via array. |
申请公布号 |
US2015028471(A1) |
申请公布日期 |
2015.01.29 |
申请号 |
US201313950122 |
申请日期 |
2013.07.24 |
申请人 |
STATS ChipPAC, Ltd. |
发明人 |
Lin Yaojian;Chen Kang;Gu Yu |
分类号 |
H01L23/498;H01L21/66 |
主分类号 |
H01L23/498 |
代理机构 |
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代理人 |
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主权项 |
1. A method of making a semiconductor device, comprising:
providing a semiconductor die; depositing an encapsulant over a first surface of the semiconductor die and around the semiconductor die; forming a first insulating layer over a second surface of the semiconductor die opposite the first surface; forming a plurality of conductive vias through the first insulating layer; and forming a first opening in the encapsulant to expose the conductive vias. |
地址 |
Singapore SG |