发明名称 Semiconductor Device, a Semiconductor Wafer Structure, and a Method for Forming a Semiconductor Wafer Structure
摘要 Embodiments relate to a semiconductor device, a semiconductor wafer structure, and a method for manufacturing or forming a semiconductor wafer structure. The semiconductor device includes a semiconductor substrate with a first region having a first conductivity type and a second region having a second conductivity type. The semiconductor device further includes an oxide structure with interrupted areas and a metal layer structure being in contact with the second region at least at the interrupted areas of the oxide.
申请公布号 US2015028456(A1) 申请公布日期 2015.01.29
申请号 US201313950783 申请日期 2013.07.25
申请人 Infineon Technologies AG 发明人 Huesken Holger;Santos Rodriguez Francisco Javier;Wagner Wolfgang
分类号 H01L23/00;H01L21/762 主分类号 H01L23/00
代理机构 代理人
主权项 1. A semiconductor device, comprising a semiconductor substrate with a first region having a first conductivity type and a second region having a second conductivity type, the second region comprising one or more sections of the second conductivity type; an oxide structure with interrupted areas; and a metal layer structure being in contact with the second region at least at the interrupted areas of the oxide, wherein a projection of the oxide structure onto the second region determines at least two interrupted areas, which are separated by portions of the oxide structure, in at least one of the one or more sections of the second region.
地址 Neubiberg DE