| 摘要 |
<p>An apparatus and a method for measuring a reflection characteristic of a material. The apparatus comprises a hollow excitation source (1), a monitoring apparatus (2), and a measurement apparatus (3). Light emitted by the hollow excitation source (1) shines on a measured sample (4). The measurement apparatus (3) receives reflected light which his reflected by the measured sample (4) and passes through the hollow part of the hollow excitation source (1). The monitoring apparatus (2) monitors light spectrum information of the light emitted by the hollow excitation source (1). By using the corresponding measurement method, comprehensive light spectrum reflection characteristic of a measured sample can be obtained by means of measurement and a calculation. The apparatus has an ingenious design and a simple light path, and can rapidly and accurately measure the luminosity, the chroma and a light spectrum characteristic of retro-reflection of a material without an optical darkroom, and has the characteristics such as a powerful function, a high measurement accuracy, a small volume, low cost, and design integration.</p> |
