发明名称 SYSTEM AND METHOD FOR DETERMINING UNFORMED SURFACE SIDE OF OPTICAL THIN FILM IN OPTICAL ARTICLE
摘要 PROBLEM TO BE SOLVED: To provide a system and method for determining an unformed surface side of an optical thin film in an optical article, capable of surely determining a film formed surface and a film unformed surface to prevent the optical thin film from being erroneously formed twice on the same surface.SOLUTION: A method for determining an unformed surface side of an optical thin film comprises: irradiating a transparent base material having an antireflection film formed on one of front and rear surfaces with laser light in an oblique direction from a laser device 12; directing first reflected light reflected on the surface of the transparent base material and second reflected light reflected on the rear surface of the transparent base material after entering the transparent base material to the incident directions of the first reflected light and the second reflected light on the surface side of the transparent base material and photographing an image by a web camera 13; and determining that the antireflection film is formed on the rear surface when the first reflected light is brighter, and an antireflection film is formed on the front surface when the second reflected light is brighter.
申请公布号 JP2015017859(A) 申请公布日期 2015.01.29
申请号 JP20130144268 申请日期 2013.07.10
申请人 TOKAI KOGAKU KK 发明人 SHOJI SHUSUKE;KATO YUJI
分类号 G01N21/17 主分类号 G01N21/17
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