发明名称 |
SEMICONDUCTOR DEVICE MANUFACTURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide an art of manufacturing an insulation film excellent in film characteristics; provide an art of manufacturing a delicate and high-voltage insulation film; and provide an art of manufacturing an insulation film which causes less electron trap.SOLUTION: A semiconductor device manufacturing method comprises: forming an oxygen and hydrogen-containing first insulation film on a semiconductor film by using any of a CVD method, a sputtering method, and a thermal oxidation method; and reducing a hydrogen content in the first insulation film and reducing a film thickness of the semiconductor film by performing a plasma treatment on the first insulation film by using plasma excited by microwave in an oxygen and inert gas-containing atmosphere. |
申请公布号 |
JP2015019091(A) |
申请公布日期 |
2015.01.29 |
申请号 |
JP20140172618 |
申请日期 |
2014.08.27 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
KAKEHATA TETSUYA;TANAKA TETSUHIRO;ASAMI YOSHINOBU |
分类号 |
H01L21/316;H01L21/31;H01L21/336;H01L21/8234;H01L21/8247;H01L27/08;H01L27/088;H01L27/10;H01L27/115;H01L29/786;H01L29/788;H01L29/792 |
主分类号 |
H01L21/316 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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