发明名称 SEMICONDUCTOR DEVICE MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide an art of manufacturing an insulation film excellent in film characteristics; provide an art of manufacturing a delicate and high-voltage insulation film; and provide an art of manufacturing an insulation film which causes less electron trap.SOLUTION: A semiconductor device manufacturing method comprises: forming an oxygen and hydrogen-containing first insulation film on a semiconductor film by using any of a CVD method, a sputtering method, and a thermal oxidation method; and reducing a hydrogen content in the first insulation film and reducing a film thickness of the semiconductor film by performing a plasma treatment on the first insulation film by using plasma excited by microwave in an oxygen and inert gas-containing atmosphere.
申请公布号 JP2015019091(A) 申请公布日期 2015.01.29
申请号 JP20140172618 申请日期 2014.08.27
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 KAKEHATA TETSUYA;TANAKA TETSUHIRO;ASAMI YOSHINOBU
分类号 H01L21/316;H01L21/31;H01L21/336;H01L21/8234;H01L21/8247;H01L27/08;H01L27/088;H01L27/10;H01L27/115;H01L29/786;H01L29/788;H01L29/792 主分类号 H01L21/316
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