发明名称 SELF-IDENTIFYING MEMORY ERRORS
摘要 A memory region can durably self-identify as being faulty when read. Information that would have been assigned to the faulty memory region can be assigned to another of that sized region in memory using a replacement encoding technique. For phase change memory, at least two fault states can be provided for durably self-identifying a faulty memory region; one state at a highest resistance range and the other state at a lowest resistance range. Replacement cells can be used to shift or assign data when a self-identifying memory fault is present. A memory controller and memory module, alone or in combination may manage replacement cell use and facilitate driving a newly discovered faulty cell to a fault state if the faulty cell is not already at the fault state.
申请公布号 US2015033064(A1) 申请公布日期 2015.01.29
申请号 US201313949227 申请日期 2013.07.24
申请人 Microsoft Corporation 发明人 Davis John D.;Strauss Karin;Manasse Mark Steven;Gopalan Parikshit S.;Yekhanin Sergey
分类号 G11C29/44 主分类号 G11C29/44
代理机构 代理人
主权项 1. A self-identifying error memory device, comprising: a plurality of memory cells arranged as memory blocks, each memory cell comprising at least two valid states and a first durable fault state, wherein a cell in the first durable fault state self-identifies as being faulty.
地址 Redmond WA US