发明名称 METHOD FOR OBTAINING EXTREME SELECTIVITY OF METAL NITRIDES AND METAL OXIDES
摘要 Methods for etching metal nitrides and metal oxides include using ultradilute HF solutions and buffered, low-pH HF solutions containing a minimal amount of the hydrofluoric acid species H2F2. The etchant can be used to selectively remove metal nitride layers relative to doped or undoped oxides, tungsten, polysilicon, and titanium nitride. A method is provided for producing an isolated capacitor, which can be used in a dynamic random access memory cell array, on a substrate using sacrificial layers selectively removed to expose outer surfaces of the bottom electrode.
申请公布号 US2015031212(A1) 申请公布日期 2015.01.29
申请号 US201414514264 申请日期 2014.10.14
申请人 MICRON TECHNOLOGY, INC. 发明人 Shea Kevin R.
分类号 H01L21/306;H01L49/02 主分类号 H01L21/306
代理机构 代理人
主权项 1. A method of selectively etching a layer of metal nitrides or metal oxide, the method comprising: heating a substrate having formed thereon a structure comprising a layer of metal oxide or metal nitride; exposing the structure to a buffered hydrofluoric acid etch solution having a pH between about 3.5 and about 5.5; and selectively etching the layer of metal oxide or metal nitride with an etch rate selectivity relative to an exposed layer of silicon greater than or equal to about 2000:1.
地址 Boise ID US