发明名称 METHODS OF FABRICATING SEMICONDUCTOR DEVICES AND SEMICONDUCTOR DEVICES FABRICATED THEREBY
摘要 The method includes forming an array of first separation walls on an underlying layer. A block co-polymer (BCP) layer is formed to fill inside regions of the first separation walls and gaps between the first separation walls. The BCP layer is phase-separated to include first domains that provide second separation walls covering inner sidewalls and outer sidewalls of the first separation walls and second domains that are separated from each other by the first domains.
申请公布号 US2015031185(A1) 申请公布日期 2015.01.29
申请号 US201314139502 申请日期 2013.12.23
申请人 SK HYNIX INC. 发明人 BAN Keun Do;HEO Jung Gun;BOK Cheol Kyu;KIM Myoung Soo
分类号 H01L21/308;H01L27/108;H01L27/24 主分类号 H01L21/308
代理机构 代理人
主权项 1. A method of fabricating a semiconductor device, the method comprising: forming an array of pillars over an underlying layer; forming a separation wall layer over the pillars and the underlying layer; forming a block co-polymer (BCP) layer over the separation wall layer to fill gaps between the pillars; and phase-separating the BCP layer into first and second domains, wherein the first domains include second separation walls formed over sidewalls of the first separation wall layer, and wherein the second domains are separated from the pillars by the first domains.
地址 Icheon KR