发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a method for manufacturing a semiconductor device using a semiconductor film containing a zinc oxide.SOLUTION: There is provided a method for manufacturing a semiconductor device. The semiconductor device comprises: a semiconductor film containing a zinc oxide and having a channel-forming region on a substrate; a gate-insulating film between the semiconductor film and a gate electrode; and a source electrode and a drain electrode electrically connected with the semiconductor film. The gate electrode is electrically connected with one of the source electrode and the drain electrode. The gate electrode is provided at a top or a bottom of the channel-forming region, and the gate electrode may be provided above the source electrode and the drain electrode. |
申请公布号 |
JP2015019093(A) |
申请公布日期 |
2015.01.29 |
申请号 |
JP20140174983 |
申请日期 |
2014.08.29 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
AKIMOTO KENGO |
分类号 |
H01L21/336;G02F1/1333;G02F1/1368;G09F9/30;H01L21/28;H01L21/316;H01L21/8234;H01L27/08;H01L27/088;H01L29/786;H01L51/50;H05B33/08;H05B33/10 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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