发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method for manufacturing a semiconductor device using a semiconductor film containing a zinc oxide.SOLUTION: There is provided a method for manufacturing a semiconductor device. The semiconductor device comprises: a semiconductor film containing a zinc oxide and having a channel-forming region on a substrate; a gate-insulating film between the semiconductor film and a gate electrode; and a source electrode and a drain electrode electrically connected with the semiconductor film. The gate electrode is electrically connected with one of the source electrode and the drain electrode. The gate electrode is provided at a top or a bottom of the channel-forming region, and the gate electrode may be provided above the source electrode and the drain electrode.
申请公布号 JP2015019093(A) 申请公布日期 2015.01.29
申请号 JP20140174983 申请日期 2014.08.29
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 AKIMOTO KENGO
分类号 H01L21/336;G02F1/1333;G02F1/1368;G09F9/30;H01L21/28;H01L21/316;H01L21/8234;H01L27/08;H01L27/088;H01L29/786;H01L51/50;H05B33/08;H05B33/10 主分类号 H01L21/336
代理机构 代理人
主权项
地址