发明名称 INSPECTION POINT SETTING DEVICE AND PROGRAM
摘要 <p>PROBLEM TO BE SOLVED: To provide an inspection point setting device and program capable of setting an inspection point for disconnection inspection to a land or a through hole positioned at the end of a conductor pattern.SOLUTION: An inspection point setting device and program read circuit board data at Step S1, extract a contour of a conductor pattern at Step S2, set a resist opening point as a point included in the inside of a resist opening at Step S3, associate the contour with the resist opening point at Step S4, set virtual radial lines radiating from the resist opening point at Step S5, select a pair of opposed lines at Step S6, select the resist opening point of interest at Step S7, determine whether there is a path having no opposed lines arising from another resist opening point among paths connecting the pair of opposed lines along the contour of the conductor pattern at Step S8, and set an inspection point there at Step S9.</p>
申请公布号 JP2015018901(A) 申请公布日期 2015.01.29
申请号 JP20130144433 申请日期 2013.07.10
申请人 HIOKI EE CORP 发明人 OKANE KAZUYUKI
分类号 H05K3/00;G06F17/50 主分类号 H05K3/00
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