发明名称 FILM FORMING PROCESS AND FILM FORMING APPARATUS
摘要 In a film forming apparatus (10), plasma-assisted ALD sequences are carried out to form a nitride film on a substrate (W) through the nitration of the silicon (Si) resulting from dichlorosilane (DCS), and then the first to fourth gas-feeding processes and plasma-feeding processes are successively carried out as plasma-assisted post-treatment. The gas to be fed in the first to fourth gas-feeding processes in the plasma-assisted post-treatment is a modifier gas consisting of either a gas selected from among N2, NH3, Ar and H2 or a mixed gas obtained by suitably mixing some of these gases. After the completion of the plasma-assisted ALD sequences, a plasma formed from the modifier gas is fed onto the nitride film on the substrate (W) to improve the film quality of the nitride film.
申请公布号 US2015031218(A1) 申请公布日期 2015.01.29
申请号 US201314384700 申请日期 2013.03.07
申请人 TOKYO ELECTRON LIMITED 发明人 Karakawa Takayuki
分类号 H01L21/02;C23C16/52;C23C16/458;C23C16/455;H01L21/67;C23C16/44 主分类号 H01L21/02
代理机构 代理人
主权项 1. A film forming process of atomic layer deposition (ALD) that forms a film by causing a first gas to be adsorbed on a substrate, and to be reacted with active species of a second gas using a film forming apparatus, the film forming process comprising: a step in which the substrate is placed; an adsorption step in which a precursor gas is chemically adsorbed on a surface of the substrate to form an adsorption layer; a first reaction step in which a first active species is generated by generating plasma of a reaction gas, and the adsorption layer is reacted with the first active species to form a film; and a second reaction step in which a second active species is generated by generating plasma of a modifier gas, and the film is modified by the second active species.
地址 Tokyo JP