TUNING-FORK BASED NEAR FIELD PROBE FOR SPECTRAL MEASUREMENT, NEAR-FIELD MICROSCOPE USING THE SAME, AND SPECTRAL ANALYSIS METHOD USING NEAR-FIELD MICROSCOPE

摘要

The present invention is provided to remove scattering from other parts, except for an end part of a nano-probe, in a near-field microscope, and to enable a spectral analysis by delaying the generation of multiple reflections caused through the shaft of the nano-probe. A first characteristic of the present invention is to temporally delay generation of multiple reflections by manufacturing a probe portion to have a predetermined length or more in a tuning-fork based near-field probe. A second characteristic of the present invention is to provide a near-field microscope which includes a tuning-fork based near-field probe having a structure as above, and can measure a time-domain transient reaction of a scattered wave. A third characteristic of the present invention is to provide a method for performing a spectral analysis on a time-domain signal measured by the near-field microscope.

主权项

1. A tuning-fork based near-field probe for spectral measurement, comprising:
a first electrode and a second electrode arranged apart from each other; and a wire-shaped nano-probe downward attached to a one-side end of the second electrode and configured to vibrate in a perpendicular direction with respect to a sample, wherein the nano-probe comprises: a shaft for receiving a terahertz pulse incidented through a means for focusing light; an end part for localizing the receive terahertz pulse to interact with the sample, and scattering a terahertz pulse, into air, which has obtained local information of the sample in the localizing procedure; and a tapered region for connecting the shaft and the end part, wherein the length of the nano-probe, which is defined as a sum of the length of the shaft and the length of the tapered region is formed to be longer than the radius of a focus of a beam by the terahertz pulse which is focused by the means for focusing light.