发明名称 |
PHOTO DEVICE INSPECTION APPARATUS AND PHOTO DEVICE INSPECTION METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a technique capable of measuring a current and an electromagnetic wave generated in a photo device in response to light irradiation at low cost.SOLUTION: A photo device inspection apparatus 100 is an apparatus for inspecting a solar battery panel 90 that is a photo device. The photo device inspection apparatus 100 includes: an irradiation unit 12 irradiating a solar battery panel 90 with a pulsed light LP 11 emitted from a femtosecond laser 121 that is a light source; an electromagnetic wave detector 132 detecting an electromagnetic pulse LT1 radiated from the solar battery panel 90; and an ammeter 14 detecting a current generated in the solar battery panel 90 in response to irradiation of the pulsed light LP11. |
申请公布号 |
JP2015017851(A) |
申请公布日期 |
2015.01.29 |
申请号 |
JP20130144127 |
申请日期 |
2013.07.10 |
申请人 |
SCREEN HOLDINGS CO LTD;OSAKA UNIV |
发明人 |
NAKANISHI HIDETOSHI;ITO AKIRA;KAWAYAMA IWAO;TOUCHI MASAKICHI |
分类号 |
G01M11/00;H01L31/04 |
主分类号 |
G01M11/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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