发明名称 PHOTO DEVICE INSPECTION APPARATUS AND PHOTO DEVICE INSPECTION METHOD
摘要 PROBLEM TO BE SOLVED: To provide a technique capable of measuring a current and an electromagnetic wave generated in a photo device in response to light irradiation at low cost.SOLUTION: A photo device inspection apparatus 100 is an apparatus for inspecting a solar battery panel 90 that is a photo device. The photo device inspection apparatus 100 includes: an irradiation unit 12 irradiating a solar battery panel 90 with a pulsed light LP 11 emitted from a femtosecond laser 121 that is a light source; an electromagnetic wave detector 132 detecting an electromagnetic pulse LT1 radiated from the solar battery panel 90; and an ammeter 14 detecting a current generated in the solar battery panel 90 in response to irradiation of the pulsed light LP11.
申请公布号 JP2015017851(A) 申请公布日期 2015.01.29
申请号 JP20130144127 申请日期 2013.07.10
申请人 SCREEN HOLDINGS CO LTD;OSAKA UNIV 发明人 NAKANISHI HIDETOSHI;ITO AKIRA;KAWAYAMA IWAO;TOUCHI MASAKICHI
分类号 G01M11/00;H01L31/04 主分类号 G01M11/00
代理机构 代理人
主权项
地址