发明名称 PROBE INSPECTION METHOD AND SURFACE SHAPE MEASUREMENT DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To provide a probe inspection method and surface shape measurement device that can easily detect the presence or absence of an abnormality such as abrasion or defect of a probe, and can secure the reliability of a measured value.SOLUTION: The probe inspection method includes the steps of: acquiring a first measured value by measuring a surface 2a to be measured of a master 2 with an unused probe 11; acquiring a second measured value by measuring a surface 2a to be measured of the master 2 with a probe 11A after its use for a predetermined period; and inspecting the deterioration state of the probe 11 by comparing the first measured value with the second measured value.</p>
申请公布号 JP2015017898(A) 申请公布日期 2015.01.29
申请号 JP20130145572 申请日期 2013.07.11
申请人 NSK LTD 发明人 TAKAHASHI HIDEKAZU
分类号 G01B5/00;G01B5/20 主分类号 G01B5/00
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