| 摘要 |
In order to determine whether the proper type of integrated circuit is located in the proper position (16) and the proper orientation, a power source (18) applies a potential difference to circuit paths (26 and 28) that will properly power an integrated circuit (14) if it is of the proper type and in the proper orientation. Without attempting to place the integrated circuit (14) in a predetermined state, a test system (10) employs a milliammeter (32) first to measure the current driven by an output terminal (30) and then to measure the current that the output terminal (30) draws from a bias source (40). If a current level consistent with an active output terminal is measured in either step, a control circuit (38) concludes that the integrated circuit (14) is of the proper type and properly positioned. Otherwise, the control circuit (38) concludes that an integrated circuit is missing, of the wrong type, or improperly oriented. The test is thus performed with power applied to the integrated circuit so that the test can be based on reliable circuit parameters, but the damage that might otherwise result from a powered-up test is avoided because, since no time is expended in conditioning the integrated circuit to a predetermined state, the test can be made extremely short in duration.
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