发明名称 SEMICONDUCTOR DEVICE AND FABRICATION METHOD
摘要 A semiconductor device using a small-sized metal contact as a program gate of an antifuse, and a method of fabricating the same are described. The semiconductor device includes a metal contact structure formed on a semiconductor substrate of a peripheral circuit area, and includes a first gate insulating layer to be ruptured. A gate structure is formed on the semiconductor substrate to one side of the metal contact structure.
申请公布号 US2015170919(A1) 申请公布日期 2015.06.18
申请号 US201514633747 申请日期 2015.02.27
申请人 SK hynix Inc. 发明人 JUNG Yong Sun
分类号 H01L21/28;H01L27/108;H01L21/283 主分类号 H01L21/28
代理机构 代理人
主权项 1. A method of fabricating a semiconductor device, the method comprising: forming a plurality of gate structures on a semiconductor substrate; and forming a metal contact structure including a first gate insulating layer on the semiconductor substrate at one side of each of the gate structures.
地址 Icheon KR