发明名称 |
SEMICONDUCTOR DEVICE AND FABRICATION METHOD |
摘要 |
A semiconductor device using a small-sized metal contact as a program gate of an antifuse, and a method of fabricating the same are described. The semiconductor device includes a metal contact structure formed on a semiconductor substrate of a peripheral circuit area, and includes a first gate insulating layer to be ruptured. A gate structure is formed on the semiconductor substrate to one side of the metal contact structure. |
申请公布号 |
US2015170919(A1) |
申请公布日期 |
2015.06.18 |
申请号 |
US201514633747 |
申请日期 |
2015.02.27 |
申请人 |
SK hynix Inc. |
发明人 |
JUNG Yong Sun |
分类号 |
H01L21/28;H01L27/108;H01L21/283 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
1. A method of fabricating a semiconductor device, the method comprising:
forming a plurality of gate structures on a semiconductor substrate; and forming a metal contact structure including a first gate insulating layer on the semiconductor substrate at one side of each of the gate structures. |
地址 |
Icheon KR |