发明名称 |
METHOD AND APPARATUS FOR CLEANING OF THREE DIMENSIONAL WAFER SURFACE |
摘要 |
<p>Disclosed is a three-dimensional wafer surface cleaning device to remove foreign substances on a three-dimensional wafer surface, wherein a three-dimensional structure is formed on the surface. The three-dimensional wafer surface cleaning device comprises: a wafer supporting unit to support a three-dimensional wafer; and a dry ice injecting unit to inject solid CO_2 dry ice to the three-dimensional wafer surface through a cleaning nozzle by producing the solid CO_2 dry ice through the adiabatic expansion of liquid CO_2 in the cleaning nozzle or around the same. The CO_2 dry ice injecting unit comprises: a CO_2 supply unit to supply the liquid CO_2 to the cleaning nozzle; and an acceleration clean air supply unit to supply clean air to the cleaning nozzle.</p> |
申请公布号 |
KR101533931(B1) |
申请公布日期 |
2015.07.03 |
申请号 |
KR20140084237 |
申请日期 |
2014.07.07 |
申请人 |
IMT CO., LTD. |
发明人 |
LEE, JONG MYOUNG;LEE, KYU PIL |
分类号 |
H01L21/302;H01L21/683 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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