发明名称 METHOD AND APPARATUS FOR CLEANING OF THREE DIMENSIONAL WAFER SURFACE
摘要 <p>Disclosed is a three-dimensional wafer surface cleaning device to remove foreign substances on a three-dimensional wafer surface, wherein a three-dimensional structure is formed on the surface. The three-dimensional wafer surface cleaning device comprises: a wafer supporting unit to support a three-dimensional wafer; and a dry ice injecting unit to inject solid CO_2 dry ice to the three-dimensional wafer surface through a cleaning nozzle by producing the solid CO_2 dry ice through the adiabatic expansion of liquid CO_2 in the cleaning nozzle or around the same. The CO_2 dry ice injecting unit comprises: a CO_2 supply unit to supply the liquid CO_2 to the cleaning nozzle; and an acceleration clean air supply unit to supply clean air to the cleaning nozzle.</p>
申请公布号 KR101533931(B1) 申请公布日期 2015.07.03
申请号 KR20140084237 申请日期 2014.07.07
申请人 IMT CO., LTD. 发明人 LEE, JONG MYOUNG;LEE, KYU PIL
分类号 H01L21/302;H01L21/683 主分类号 H01L21/302
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