发明名称 Translating between testing requirements at different reference points
摘要 Embodiments of the claimed subject matter provide a method and apparatus for translating testing requirements between different reference points. Some embodiments of the method include generating mapping information that relates at least one first requirement associated with an active antenna array to at least one second requirement associated with the active antenna array. The first requirements are associated with a first reference point and the second requirements are associated with a second reference point that differs from the first reference point. Some embodiments of the method also include storing the mapping information in a non-transitory computer-readable storage media.
申请公布号 US9088356(B2) 申请公布日期 2015.07.21
申请号 US201213667592 申请日期 2012.11.02
申请人 Alcatel Lucent 发明人 Hu Teck
分类号 H04B17/15;H04B17/10 主分类号 H04B17/15
代理机构 Davidson Sheehan LLP 代理人 Davidson Sheehan LLP
主权项 1. A method, comprising: generating mapping information that relates at least one first requirement associated with an active antenna array to at least one second requirement associated with the active antenna array, wherein said at least one first requirement is associated with a first reference point located between baseband circuitry and the active antenna array and said at least one second requirement is associated with a second reference point located in a far-field region of the active antenna array; and storing said mapping information in a non-transitory computer-readable storage media.
地址 Boulogne-Billancourt FR