发明名称 High Voltage Diode
摘要 A trench-isolated RESURF diode structure (100) is provided which includes a substrate (150) in which is formed anode (130, 132) and cathode (131) contact regions separated from one another by a shallow trench isolation region (114, 115), along with a non-uniform cathode region (104) and peripheral anode regions (106, 107) which define vertical and horizontal p-n junctions under the anode contact regions (130, 132), including a horizontal cathode/anode junction that is shielded by the heavily doped anode contact region (132).
申请公布号 US2015228713(A1) 申请公布日期 2015.08.13
申请号 US201514697195 申请日期 2015.04.27
申请人 Lin Xin;Yang Hongning;Zuo Jiang-Kai 发明人 Lin Xin;Yang Hongning;Zuo Jiang-Kai
分类号 H01L29/06;H01L29/861;H01L27/12 主分类号 H01L29/06
代理机构 代理人
主权项 1. A semiconductor diode device, comprising: a semiconductor substrate region; an isolation structure for electrically isolating the semiconductor substrate region; a heavily doped first terminal contact region of a first conductivity type formed in the semiconductor substrate region; a heavily doped second terminal contact region of a second conductivity type located in the semiconductor substrate region to be spaced apart from the heavily doped first terminal contact region; a first terminal well region of the first conductivity type located in the semiconductor substrate region and under a first portion of the heavily doped first terminal contact region; and a second terminal well region of the second conductivity type located in the semiconductor substrate region comprising a deep portion located around the heavily doped second terminal contact region and a shallow portion that extends from the deep portion to the first terminal well region, where a peripheral portion of the shallow portion is located under a second portion of the heavily doped first terminal contact region.
地址 Phoenix AZ US