发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE INCLUDING NICKEL-CONTAINING FILM
摘要 A method of manufacturing a semiconductor device is provided. A substrate including a structure in which a hole is formed is prepared. Precursors including a nickel alkoxide compound are vaporized. A nickel-containing layer is formed in the hole by providing the vaporized precursors including the nickel alkoxide compound onto the substrate.
申请公布号 US2015228663(A1) 申请公布日期 2015.08.13
申请号 US201514598659 申请日期 2015.01.16
申请人 Samsung Electronics Co., Ltd. 发明人 Youn Sang-chul;Park Gyu-hee;Cho Youn-joung;Ryu Seung-min
分类号 H01L27/115;H01L21/285;H01L29/49;H01L21/768 主分类号 H01L27/115
代理机构 代理人
主权项 1. A method of manufacturing a semiconductor device, the method comprising: preparing a substrate comprising a structure in which a hole is formed; vaporizing precursors comprising a nickel alkoxide compound; and forming a nickel-containing layer in the hole by providing the vaporized precursors comprising the nickel alkoxide compound onto the substrate.
地址 Suwon-si KR