发明名称 SEMICONDUCTOR MEMORY APPARATUS AND OPERATING METHOD THEREOF
摘要 A semiconductor memory apparatus may include an error check and correction circuit block configured to receive a plurality of cell data, and output error-checked data and error data discrimination signals after receiving an error check enable signal; and a data bus inversion circuit block configured to receive the plurality of cell data, and output the plurality of cell data by inverting or non-inverting the cell data after receiving a read data bus inversion enable signal, the error check enable signal and the error data discrimination signals.
申请公布号 US2015227417(A1) 申请公布日期 2015.08.13
申请号 US201414282379 申请日期 2014.05.20
申请人 SK hynix Inc. 发明人 KIM Jae Il
分类号 G06F11/10 主分类号 G06F11/10
代理机构 代理人
主权项 1. A semiconductor memory apparatus comprising: an error check and correction circuit block configured to receive a plurality of cell data, and output error-checked data and error data discrimination signals after receiving an error check enable signal; and a data bus inversion circuit block configured to receive the plurality of cell data, and output the plurality of cell data by inverting or non-inverting the cell data in response to a read data bus inversion enable signal, the error check enable signal and the error data discrimination signals.
地址 Icheon-si KR