发明名称 TEST DEVICE AND TEST METHOD FOR SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 PROBLEM TO BE SOLVED: To test a differential output circuit in a short period of time without using a dedicated test circuit. ! SOLUTION: A test method of the present invention for testing a differential output circuit that outputs a pair of differential signals includes: setting the normal operation range of the potentials of the signals on the basis of the allowable range of each of the differential voltage and in-phase voltage at which the circuit operates normally; setting the potential determination range on the basis of the potential of each of two pairs of standard signals; determining whether or not the potential determination range is within the normal operation range; and determining whether or not the potential of each of the differential signals is within the potential determination range. Setting the potential determination range includes changing the potential determination range due to a change in the potential of at least any of the two pairs of standard signals. This test method repeatedl
申请公布号 JP2015158377(A) 申请公布日期 2015.09.03
申请号 JP20140031960 申请日期 2014.02.21
申请人 MEGA CHIPS CORP 发明人 MATSUO NAOYA
分类号 G01R31/316;G01R31/28 主分类号 G01R31/316
代理机构 代理人
主权项
地址