Method and apparatus for device testing using multiple processing paths

摘要

According to some aspects, a method of operating an automatic test system comprising a plurality of paths and programmed with a test pattern is provided. One such method comprises executing vectors in the test pattern with circuitry comprising a plurality of paths, the executing comprising upon processing, in a first of the plurality of paths, the operation portion of a vector specifying an operation capable of generating a branch in the flow of execution of the vectors in the test pattern to a non-sequential location in the test pattern, initiating processing of the test pattern in a second of the plurality of paths from the non-sequential location. Some aspects include a system for executing instructions comprising a plurality of paths comprising control circuitry to initiate processing of operation portions from sequential locations of a memory within an available path of the plurality of paths.

主权项

1. A method of operating an automatic test system programmed with a test pattern comprising a plurality of vectors, the plurality of vectors each being associated with a location within the test pattern, and each of at least a portion of the plurality of vectors comprising an operation portion and a data portion, the operation portion defining an operation to determine a location of a subsequent vector during execution of the test pattern, and the data portion at least in part characterizing actions to be performed by the test system to generate or measure test signals at a plurality of test points of a device under test upon execution of the vector, the method comprising:
executing vectors in the test pattern with circuitry comprising a plurality of paths, each of the plurality of paths configured for processing operation portions of vectors and each of the plurality of paths pipelined with a plurality of ranks, the executing comprising:
upon processing, in a first of the plurality of paths, an operation portion of a vector specifying an operation capable of generating a branch in the flow of execution of the vectors in the test pattern to a non-sequential location in the test pattern, initiating processing of the test pattern in a second of the plurality of paths from the non-sequential location; andselecting a value from an operation portion in a path of the plurality of paths, said selecting comprising selecting a path and a rank within the selected path from which to access the value.