| 摘要 |
PROBLEM TO BE SOLVED: To provide a contact type circuit pattern detection device and method that more efficiently image and detect a plurality of printed substrate pieces.SOLUTION: A contact type circuit pattern detection device for detecting a printed substrate including a plurality of printed substrate pieces comprises a probe unit that has a camera unit and an inspection unit provided. Respective pieces are configured to have an alignment characteristic point, and the camera unit is configured to image the alignment characteristic point, and the inspection unit is configured to contact with the piece to inspect a conductive pattern. The contact type circuit pattern detection device further comprises: a movement mechanism that causes the probe unit to move; and a computation unit that calculates a minimum movement route of the probe unit at a time of imaging and inspecting. The minimum movement route is configured to apply a condition conducting detection of the piece after imaging all alignment characteristic points on the piece to one piece of a plurality of pieces, and calculate the minimum movement route by applying the condition to all of the plurality of pieces. |
