发明名称 INTEGRATED CIRCUIT WITH NANOWIRE SENSORS COMPRISING A SHIELDING LAYER, SENSING APPARATUS, MEASURING METHOD AND MANUFACTURING METHOD
摘要 An integrated circuit (100) comprising a substrate (110); an insulating layer (120) over said substrate; and a first nanowire element (140a) and a second nanowire element (140b) adjacent to said first nanowire element on said insulating layer; wherein the first nanowire element is arranged to be exposed to a medium comprising an analyte of interest, and wherein the second nanowire element is shielded from said medium by a shielding layer (150) over said second nanowire element. A sensing apparatus including such an IC, a sensing method using such an IC and a method of manufacturing such an IC are also disclosed.
申请公布号 US2015293054(A1) 申请公布日期 2015.10.15
申请号 US201314435546 申请日期 2013.10.16
申请人 KONINKLIJKE PHILIPS N.V. 发明人 Klootwijk Johan Hendrik;Mescher Marleen;Alarcon-Rivero Manuel Eduardo;De Wild Nico Maris Adriaan
分类号 G01N27/414;H01L29/66;H01L27/12;H01L29/06;H01L29/786 主分类号 G01N27/414
代理机构 代理人
主权项 1. An integrated circuit comprising: a substrate; an insulating layer over said substrate; and a first nanowire element and a second nanowire element on said insulating layer; wherein the first nanowire element is a source node of a first transistor and the second nanowire element is a source node of a second transistor. said first transistor and said second transistor having a common drain node, wherein the first nanowire element is arranged for exposure to a medium comprising an analyte, and wherein the second nanowire element is arranged to be shielded from said medium by a shielding layer over said second nanowire element.
地址 Eindhoven NL