发明名称 |
INTEGRATED CIRCUIT WITH NANOWIRE SENSORS COMPRISING A SHIELDING LAYER, SENSING APPARATUS, MEASURING METHOD AND MANUFACTURING METHOD |
摘要 |
An integrated circuit (100) comprising a substrate (110); an insulating layer (120) over said substrate; and a first nanowire element (140a) and a second nanowire element (140b) adjacent to said first nanowire element on said insulating layer; wherein the first nanowire element is arranged to be exposed to a medium comprising an analyte of interest, and wherein the second nanowire element is shielded from said medium by a shielding layer (150) over said second nanowire element. A sensing apparatus including such an IC, a sensing method using such an IC and a method of manufacturing such an IC are also disclosed. |
申请公布号 |
US2015293054(A1) |
申请公布日期 |
2015.10.15 |
申请号 |
US201314435546 |
申请日期 |
2013.10.16 |
申请人 |
KONINKLIJKE PHILIPS N.V. |
发明人 |
Klootwijk Johan Hendrik;Mescher Marleen;Alarcon-Rivero Manuel Eduardo;De Wild Nico Maris Adriaan |
分类号 |
G01N27/414;H01L29/66;H01L27/12;H01L29/06;H01L29/786 |
主分类号 |
G01N27/414 |
代理机构 |
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代理人 |
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主权项 |
1. An integrated circuit comprising:
a substrate; an insulating layer over said substrate; and a first nanowire element and a second nanowire element on said insulating layer; wherein the first nanowire element is a source node of a first transistor and the second nanowire element is a source node of a second transistor. said first transistor and said second transistor having a common drain node, wherein the first nanowire element is arranged for exposure to a medium comprising an analyte, and wherein the second nanowire element is arranged to be shielded from said medium by a shielding layer over said second nanowire element. |
地址 |
Eindhoven NL |