| 发明名称 |
COMPUTING DEVICE, COMPUTING PROGRAM, X-RAY MEASURING SYSTEM AND X-RAY MEASURING METHOD |
| 摘要 |
A computing device configured to obtain information about a subject using a detection result detected by an X-ray detector which detects an X-ray passing through the subject, which device includes: a unit configured to obtain a detection result of the X-ray detector; a first obtaining unit configured to obtain a complex refractive index of the X-ray after passing through the subject using the detection result; and a second obtaining unit configured to obtain information about the subject in accordance with a correlation between the complex refractive index and a mass absorption coefficient. |
| 申请公布号 |
US2015293041(A1) |
申请公布日期 |
2015.10.15 |
| 申请号 |
US201314441494 |
申请日期 |
2013.10.28 |
| 申请人 |
CANON KABUSHIKI KAISHA |
发明人 |
Mukaide Taihei |
| 分类号 |
G01N23/083 |
主分类号 |
G01N23/083 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A computing device configured to obtain information about a subject using a detection result detected by an X-ray detector which detects an X-ray passing through the subject, the device comprising:
a unit configured to obtain a detection result of the X-ray detector; a first obtaining unit configured to obtain a complex refractive index of the X-ray after passing through the subject using the detection result; and a second obtaining unit configured to obtain information about the subject in accordance with a correlation between the complex refractive index and a mass absorption coefficient. |
| 地址 |
Tokyo, JP |
