发明名称 |
On-Line FT-NIR Method to Determine Particle Size and Distribution |
摘要 |
This invention relates to a method for the determination of the average particle size or particle size distribution of a material in a gas phase reactor comprising: 1) analyzing the average particle size and particle size distribution of a baseline composition using the method described in ASTM D1921; 2) analyzing the average particle size and particle size distribution of said baseline composition using an FT-NIR analysis technique; 3) preparing a calibration matrix by comparing results from said reference analytical technique to the results from said FT-NIR analysis technique; 4) analyzing the material using an FT-NIR technique; and 5) identifying and quantifying the type and content of particles present in the material by comparing spectral data obtained from said FT-NIR technique of the material to said calibration matrix.;This invention also relates to a process for determining polymer properties in a polymerization reactor system using such techniques. |
申请公布号 |
US2015293005(A1) |
申请公布日期 |
2015.10.15 |
申请号 |
US201514639258 |
申请日期 |
2015.03.05 |
申请人 |
ExxonMobil Chemical Patents Inc. |
发明人 |
Reimers Jay L. |
分类号 |
G01N15/02;G01J3/45 |
主分类号 |
G01N15/02 |
代理机构 |
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代理人 |
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主权项 |
1. A method for the determination of the average particle size or particle size distribution of a material in a gas phase reactor comprising:
a) analyzing the average particle size and particle size distribution of a baseline composition using the method described in ASTM D1921; b) analyzing the average particle size and particle size distribution of said baseline composition using a Fourier Transform-Near Infrared, FT-NIR, analysis technique; c) preparing a calibration matrix by comparing results from said reference analytical technique from step a) to the results from said FT-NIR analysis technique from step b); d) analyzing the material using an FT-NIR technique; and e) identifying and quantifying the type and content of particles present in the material by comparing spectral data obtained from said FT-NIR technique of the material to said calibration matrix. |
地址 |
Baytown TX US |