发明名称 METHOD TO DETERMINE SKIN-LAYER THICKNESS IN HIGH PRESSURE DIE CASTINGS
摘要 Provided is a quantitative metallic method for measuring a skin layer thickness in high pressure die cast aluminum components. A rapid-cooling skin layer area presents eutectic phases of higher volume ratio compared with a slow cooling inner area, so measurements presenting such higher phases are used to quantify the layer thickness. Images in various thicknesses on a corresponding location in a cast component sample are obtained by using an image analyzer in advance, and eutectic volume ratios in each stored image are determined. The determined volume ratios are compared for the noted or predicted amount of a specific alloy composition, and the result is related to the skin layer thickness through differences between the stored or measured amounts and a noted standard.
申请公布号 KR20150118915(A) 申请公布日期 2015.10.23
申请号 KR20150052234 申请日期 2015.04.14
申请人 GM GLOBAL TECHNOLOGY OPERATIONS LLC 发明人 WANG QIGUI;YANG WENYING;KNIGHT JAMES W.
分类号 B22D17/22;G06Q50/04 主分类号 B22D17/22
代理机构 代理人
主权项
地址
您可能感兴趣的专利