发明名称 CHEMICAL MECHANICAL POLISHING PAD WITH CLEAR ENDPOINT DETECTION WINDOW
摘要 Provided is a chemical mechanical polishing pad containing a polishing layer having a polishing surface, and an endpoint detection window. The endpoint detection window comprises an isocyanate terminated urethane prepolymer which is a reaction product of ingredients including an aliphatic polyfunctional isocyanate and a prepolymer polyol, having 5.5 to 9.5 wt% of unreacted NCO groups; and a curative system comprising 0 to 99 wt% of a difunctional curative and 1 to 100 wt% of an amine initiated polyol curative having at least one nitrogen atom per molecule and an average of at least three hydroxyl groups per molecule. Also, provide are methods for manufacturing and using the chemical mechanical polishing pad.
申请公布号 KR20150124897(A) 申请公布日期 2015.11.06
申请号 KR20150057837 申请日期 2015.04.24
申请人 ROHM AND HAAS ELECTRONIC MATERIALS CMP HOLDINGS, INC.;DOW GLOBAL TECHNOLOGIES LLC 发明人 QIAN BAINIAN;DEGROOT MARTY
分类号 H01L21/304;C08G18/06 主分类号 H01L21/304
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