发明名称 |
RADIATION-SENSITIVE RESIN COMPOSITION, POLYMER, AND METHOD FOR FORMING RESIST PATTERN |
摘要 |
PROBLEM TO BE SOLVED: To provide: a radiation-sensitive resin composition that gives a favorable pattern profile, excels in MEEF (mask error enhancement factor) performance, and less likely causes defects such as a bridge; a polymer suitably used for the radiation-sensitive resin composition; and a method for forming a pattern using the radiation-sensitive resin composition.SOLUTION: The radiation-sensitive resin composition comprises: [A] a polymer having a (meth)acrylate unit (I) that has an acid-dissociable group with a five-membered or six-membered ring alicyclic structure, and a (meth)acrylate unit structure (II) that has a terminal ester structure and a connecting group including a fluorine atom or a fluorinated hydrocarbon group, in which the content of fluorine atoms is 5 mass% or more; [B] a polymer having an acid-dissociable group and having a content of fluorine atoms of less than 5 mass%; and [C] a radiation-sensitive acid generator. The content of the [A] polymer is preferably 0.1 parts by mass or more and 20 parts by mass or less with respect to 100 parts by mass of the [B] polymer. |
申请公布号 |
JP2015200895(A) |
申请公布日期 |
2015.11.12 |
申请号 |
JP20150093488 |
申请日期 |
2015.04.30 |
申请人 |
JSR CORP |
发明人 |
KIRITOSHI YUKO;NARUOKA TAKEHIKO;NISHIMURA YUKIO;ASANO YUSUKE;KAWAKAMI TAKANORI;NAKAJIMA HIROMITSU |
分类号 |
G03F7/004;C08F220/18;G03F7/039;G03F7/20 |
主分类号 |
G03F7/004 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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