发明名称 |
SUPPORTING AUTOMATED TESTING OF DEVICES IN A TEST FLOOR SYSTEM |
摘要 |
In an embodiment, a test floor apparatus includes at least one conveyor, a vertical stack buffer, and an automated handling station. The vertical stack buffer is operable to hold a plurality of DUT (device under test) receptacles and operable to place a DUT receptacle on the at least one conveyor to enable a corresponding DUT to be inserted into the DUT receptacle. The automated handling station is operable to access the DUT receptacle from the at least one conveyor and is operable to open the DUT receptacle to position the corresponding DUT in a manner that couples the corresponding DUT to an electrical interface of the DUT receptacle and that encloses the corresponding DUT inside the DUT receptacle to facilitate testing of the corresponding DUT. |
申请公布号 |
US2015355268(A1) |
申请公布日期 |
2015.12.10 |
申请号 |
US201514736139 |
申请日期 |
2015.06.10 |
申请人 |
Advantest Corporation |
发明人 |
ROGEL-FAVILA Ben;FISHMAN James |
分类号 |
G01R31/28 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
1. A test floor apparatus, comprising:
at least one conveyor; a vertical stack buffer operable to hold a plurality of DUT (device under test) receptacles and operable to place a DUT receptacle on the at least one conveyor to enable a corresponding DUT to be inserted into the DUT receptacle; and an automated handling station operable to access the DUT receptacle from the at least one conveyor and operable to open the DUT receptacle to position the corresponding DUT in a manner that couples the corresponding DUT to an electrical interface of the DUT receptacle and that encloses the corresponding DUT inside the DUT receptacle to facilitate testing of the corresponding DUT. |
地址 |
Tokyo JP |