发明名称 |
Microparticle detection apparatus |
摘要 |
<p>A microparticle detection apparatus is provided. The microparticle detection apparatus includes a light emitting optical element, a converging optical system disposed in an advancing direction of light emitted from the optical element to converge the light, a particle path located in an advancing direction of the light having passed through the converging optical system so that the particle path intersects the light, a beam blocking unit to block direct light having passed through the particle path, a condensing lens disposed at the rear of the beam blocking unit, and a detector disposed at the rear of the condensing lens to detect light scattered by particles. A focal point of light formed by the optical element and the converging optical system may be located at the rear of the particle path. A focal point of light irradiated to the particles may be different from the introduction position of the particles.</p> |
申请公布号 |
EP2472248(A3) |
申请公布日期 |
2015.12.16 |
申请号 |
EP20110195834 |
申请日期 |
2011.12.27 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD.;KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY |
发明人 |
KWON, JOONHYUNG;YOON, DU SEOP;ROH, HEE YUEL;KIM, SOO HYUN;RYU, SUNG YOON;KWON, WON SIK;LEE, HYUB |
分类号 |
G01N15/06;G01N21/21;G01N21/53;G01N21/64 |
主分类号 |
G01N15/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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