发明名称 Microparticle detection apparatus
摘要 <p>A microparticle detection apparatus is provided. The microparticle detection apparatus includes a light emitting optical element, a converging optical system disposed in an advancing direction of light emitted from the optical element to converge the light, a particle path located in an advancing direction of the light having passed through the converging optical system so that the particle path intersects the light, a beam blocking unit to block direct light having passed through the particle path, a condensing lens disposed at the rear of the beam blocking unit, and a detector disposed at the rear of the condensing lens to detect light scattered by particles. A focal point of light formed by the optical element and the converging optical system may be located at the rear of the particle path. A focal point of light irradiated to the particles may be different from the introduction position of the particles.</p>
申请公布号 EP2472248(A3) 申请公布日期 2015.12.16
申请号 EP20110195834 申请日期 2011.12.27
申请人 SAMSUNG ELECTRONICS CO., LTD.;KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY 发明人 KWON, JOONHYUNG;YOON, DU SEOP;ROH, HEE YUEL;KIM, SOO HYUN;RYU, SUNG YOON;KWON, WON SIK;LEE, HYUB
分类号 G01N15/06;G01N21/21;G01N21/53;G01N21/64 主分类号 G01N15/06
代理机构 代理人
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