| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a learning apparatus capable of enhancing accuracy of a pattern classifier. <P>SOLUTION: A misclassification measure value D<SB POS="POST">y</SB>(x;Λ) of an input pattern is defined by formula (1). A value of each parameter is adjusted so that a value of a minimization target function is minimized. <P>COPYRIGHT: (C)2013,JPO&INPIT</p> |
