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发明名称
半导体制程;FABRICATION METHOD OF SEMICONDUCTOR STRUCTURE
摘要
本发明提供一种半导体制程,系包含以下步骤。首先,在一基底上形成一闸极结构,并且在该基底及该闸极结构上形成一第一材料层。接着,将硼掺质布植至该闸极结构两侧之该基底中,形成一第一掺杂区,并且将P型导电掺质布植至该闸极结构两侧之该基底中,形成一第二掺杂区。随后,在该第一材料层上形成一第二材料层。最后,依序蚀刻该第二材料层、该第一材料层以及该基底,且在该闸极结构两侧之该基底形成一凹槽,其中,该凹槽位在该第一掺杂区之范围内。
申请公布号
TW201546883
申请公布日期
2015.12.16
申请号
TW103120175
申请日期
2014.06.11
申请人
联华电子股份有限公司 UNITED MICROELECTRONICS CORP.
发明人
吴彦良 WU, YEN LIANG;张仲甫 CHANG, CHUNG FU;洪裕祥 HUNG, YU HSIANG;傅思逸 FU, SSU I;吕曼绫 LU, MAN LING;刘家荣 LIU, CHIA JONG;沈文骏 SHEN, WEN JIUN;陈意维 CHEN, YI WEI
分类号
H01L21/28(2006.01);H01L21/306(2006.01)
主分类号
H01L21/28(2006.01)
代理机构
代理人
吴丰任戴俊彦
主权项
地址
新竹市新竹科学工业园区力行二路3号 TW
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