摘要 |
<p>An improved correlation method that computes E field measurements from voltage measurements produced by a TEM cell. Twelve voltage measurements are taken of radiation emanating from a device under test (DUT) (18) for respective frequencies. The measurements are taken for the six faces of a hypothetical cube (30) enclosing the DUT (18) in both polarizations. Using these twelve measurements, the method identifies the face and polarization of the DUT (18) which produces the highest emanation of radiation at that respective frequency. The method obtains three input voltages from these measurements and determines if the assumption of a dipole gain is adequate. If not, the actual gain is calculated and is used in a 3-input correlation algorithm to obtain more correct data regarding the E field emission of the DUT.</p> |