发明名称 半導体メモリ装置
摘要 <p>In a memory cell, a transistor with extremely high off-resistance is used as a write transistor; a drain and a source of the write transistor are connected to a write bit line and an input of an inverter, respectively; and a drain and a source of a read transistor are connected to a read bit line and an output of the inverter, respectively. Capacitors may be intentionally disposed to the source of the write transistor. Alternatively, parasitic capacitance may be used. Since the data retention is performed using charge stored on these capacitors, a potential difference between power sources for the inverter can be 0. This eliminates leakage current between the positive and negative electrodes of the inverter, thereby reducing power consumption.</p>
申请公布号 JP5833884(B2) 申请公布日期 2015.12.16
申请号 JP20110232376 申请日期 2011.10.24
申请人 株式会社半導体エネルギー研究所 发明人 竹村 保彦
分类号 G11C11/405;G11C11/402;G11C11/412 主分类号 G11C11/405
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