发明名称 PHOTOLITHOGRAPHY MASK AND METHOD OF MANUFACTURING THEREOF
摘要 <p>A photolithography mask (30) comprises transparent regions (32), opaque regions (33), and semitransparent regions (31). When a photosensitive resin material is exposed through this mask, resist patterns of different thicknesses are formed. The mask is produced by forming opaque film (3) on a transparent substrate (1), patterning the opaque film (3), forming semitransparent film (4), and patterning the semitransparent film (4).</p>
申请公布号 WO2000045222(P1) 申请公布日期 2000.08.03
申请号 JP2000000408 申请日期 2000.01.27
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