发明名称 |
High frequency phase shifter array testing |
摘要 |
Aspects of the invention provide for an architecture and method for testing high frequency phase shifter arrays. In one embodiment, an architecture for testing a phase shifter array, includes: a plurality of power dividers, each power divider configured to receive an output from a phase shifter within the phase shifter array and split the output into a first signal and a second signal; a plurality of power clippers, each power clipper configured to receive the second signal and modify the second signal by limiting an amplitude of the second signal; a first power combiner configured to receive the first signal from each of the plurality of power dividers to generate a first output; and a second power combiner configured to receive the modified second signal from each of the plurality of power clippers to generate a second output. |
申请公布号 |
US9214726(B2) |
申请公布日期 |
2015.12.15 |
申请号 |
US201313746029 |
申请日期 |
2013.01.21 |
申请人 |
International Business Machines Corporation |
发明人 |
Aydin Adem G.;Ding Hanyi |
分类号 |
H01Q3/26 |
主分类号 |
H01Q3/26 |
代理机构 |
Hoffman Warnick LLC |
代理人 |
Meyers Steven J;Hoffman Warnick LLC |
主权项 |
1. An architecture for testing a phase shifter array, comprising:
a plurality of power dividers, each power divider configured to receive an output from a phase shifter within the phase shifter array and split the output into a first signal and a second signal; a plurality of power clippers, each power clipper configured to receive the second signal and modify the second signal by limiting an amplitude of the second signal; a first power combiner configured to receive the first signal from each of the plurality of power dividers to generate a first output; and a second power combiner configured to receive the modified second signal from each of the plurality of power clippers to generate a second output. |
地址 |
Armonk NY US |