发明名称 High frequency phase shifter array testing
摘要 Aspects of the invention provide for an architecture and method for testing high frequency phase shifter arrays. In one embodiment, an architecture for testing a phase shifter array, includes: a plurality of power dividers, each power divider configured to receive an output from a phase shifter within the phase shifter array and split the output into a first signal and a second signal; a plurality of power clippers, each power clipper configured to receive the second signal and modify the second signal by limiting an amplitude of the second signal; a first power combiner configured to receive the first signal from each of the plurality of power dividers to generate a first output; and a second power combiner configured to receive the modified second signal from each of the plurality of power clippers to generate a second output.
申请公布号 US9214726(B2) 申请公布日期 2015.12.15
申请号 US201313746029 申请日期 2013.01.21
申请人 International Business Machines Corporation 发明人 Aydin Adem G.;Ding Hanyi
分类号 H01Q3/26 主分类号 H01Q3/26
代理机构 Hoffman Warnick LLC 代理人 Meyers Steven J;Hoffman Warnick LLC
主权项 1. An architecture for testing a phase shifter array, comprising: a plurality of power dividers, each power divider configured to receive an output from a phase shifter within the phase shifter array and split the output into a first signal and a second signal; a plurality of power clippers, each power clipper configured to receive the second signal and modify the second signal by limiting an amplitude of the second signal; a first power combiner configured to receive the first signal from each of the plurality of power dividers to generate a first output; and a second power combiner configured to receive the modified second signal from each of the plurality of power clippers to generate a second output.
地址 Armonk NY US