发明名称 RESIST MATERIAL
摘要 PROBLEM TO BE SOLVED: To provide a resist material capable of forming a resist line having a uniform line width. SOLUTION: The resist material applied on a substrate 10 so as to carry out microfabrication with light, electron beams or X-rays contains a liquid- crystalline polymer 11 which aligns in a direction perpendicular to the surface of the substrate 10 as the longitudinal direction in a resist film 12 in film formation on the substrate 10.
申请公布号 JP2001324802(A) 申请公布日期 2001.11.22
申请号 JP20000141302 申请日期 2000.05.15
申请人 NIKON CORP 发明人 SUGANUMA WAKAKO
分类号 G03F7/004;H01L21/027 主分类号 G03F7/004
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