发明名称 Thin body switch transistor
摘要 An integrated recessed thin body field effect transistor (FET) and methods of manufacture are disclosed. The method includes recessing a portion of a semiconductor material. The method further includes forming at least one gate structure within the recessed portion of the semiconductor material.
申请公布号 US9214561(B2) 申请公布日期 2015.12.15
申请号 US201313929256 申请日期 2013.06.27
申请人 GLOBALFOUNDRIES INC. 发明人 Abou-Khalil Michel J.;Botula Alan B.;Jaffe Mark D.;Joseph Alvin J.;Slinkman James A.
分类号 H01L21/336;H01L21/3205;H01L21/4763;H01L29/786;H01L21/28;H01L21/84;H01L29/66 主分类号 H01L21/336
代理机构 Robert Mlotkowski Safran & Cole, P.C. 代理人 LeStrange Michael J.;Calderon Andrew M.;Robert Mlotkowski Safran & Cole, P.C.
主权项 1. A method, comprising: etching portions of an insulator material formed on semiconductor material to expose a surface of the semiconductor material; recessing a portion of the semiconductor material via an oxidation process which forms an oxide region and a subsequent etching process to remove the oxide region thereby exposing the recessed portion of the semiconductor material, wherein the semiconductor material is silicon on insulator (SOI) material and the oxidation process forms the oxide region within the SOI material; forming at least one gate structure within the recessed portion of the semiconductor material; and forming channel regions for the at least one gate structure on both a recessed SOI region and a thicker SOI region, wherein the recessed SOI region is surrounded by the thicker SOI region which is protected during the oxidation process and the removing of the oxide region.
地址 Grand Cayman KY