发明名称 Resistive random access memory cell structure with reduced programming voltage
摘要 A cell of a resistive random access memory including (i) a resistive element and (ii) a switch. The resistive element includes (i) a first electrode, and (ii) a second electrode. The switch includes (i) a first terminal connected to a first contact, and (i) a second terminal connected to a second contact. The second contact is connected to the second electrode of the resistive element via a third contact. The third contact has a shape including a first surface and a second surface that is opposite to the first surface. The shape of the third contact tapers inward from the first surface towards the second surface.
申请公布号 US9214230(B2) 申请公布日期 2015.12.15
申请号 US201514594940 申请日期 2015.01.12
申请人 Marvell World Trade LTD. 发明人 Sutardja Pantas;Wu Albert;Lee Winston;Lee Peter;Chang Runzi
分类号 G11C13/00;H01L45/00;H01L27/24 主分类号 G11C13/00
代理机构 代理人
主权项 1. A cell of a resistive random access memory, the cell comprising: a resistive element including (i) a first electrode, and (ii) a second electrode; and a switch including (i) a first terminal connected to a first contact, and (i) a second terminal connected to a second contact, wherein the second contact is connected to the second electrode of the resistive element via a third contact, wherein the third contact has a shape including a first surface and a second surface that is opposite to the first surface, and wherein the shape of the third contact tapers inward from the first surface towards the second surface.
地址 St. Michael BB