发明名称 |
APPARATUS FOR INSPECTING A SURFACE OF GLASS AND METHOD FOR INSPECTING A SURFACE OF GLASS |
摘要 |
The present invention relates to an apparatus to inspect a surface defect of a subject, and a method to inspect the surface defect of the subject. The apparatus to inspect the surface defect of the subject comprises: a light source arranged in one lateral surface of the subject to irradiate light inside the subject; a first photographing part to collect emitted light from a defect of the subject, and to output an electric signal corresponding to the collected light; a second photographing part to collect emitted light from a defect of the subject in a position different from the first image output part, and to output the electric signal corresponding to the collected light; and a processing part to generate a first image and a second image based on the electric signal output from the first photographing part and the second photographing part, and to determine a type of defect in accordance to a difference between the first image and the second image. |
申请公布号 |
KR20150140035(A) |
申请公布日期 |
2015.12.15 |
申请号 |
KR20140068194 |
申请日期 |
2014.06.05 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
NOH, JAE HEON;KANG, MYEONG HEON |
分类号 |
G01N21/896;G01N21/95 |
主分类号 |
G01N21/896 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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