| 摘要 |
PROBLEM TO BE SOLVED: To provide an environment test device which proposes an encapsulation structure resistant to high temperature and having high seal performance, and in which leakage is few and it is possible to maintain the inside of a test room at a desired temperature easily.SOLUTION: An environment test device is a hot-cold shock testing device, alternately repeating a high temperature exposure mode and a low temperature exposure mode. A high temperature-side air circulation path is formed between a test room and a high temperature-side temperature adjustment room, the high temperature-side air circulation path being provided with a high temperature introduction-side damper 8 and a high temperature discharge-side damper. A high temperature introduction opening 33 is sealed as a corner side 51 composed of the opening edge of the high temperature introduction opening 33 is pressed against a packing member 50 provided in the high temperature introduction-side damper 8. The packing member 50 is the one in which a fiber 52 having heat resistance, such as a ceramic fiber, is covered with a metallic cloth-like material 53. |
