发明名称 CONTROL SYSTEM ABNORMALITY DETERMINATION DEVICE, AND CONTROL SYSTEM ABNORMALITY DETERMINATION METHOD
摘要 PROBLEM TO BE SOLVED: To provide a control system abnormality determination device which eliminates the need for collection, registration or the like of data for abnormality determination, is implemented easily by data of a short period, and has a simple configuration for a reduced cost.SOLUTION: There is provided a control system abnormality determination device 1 which determines abnormality in a control system 2 including: a measurement instrument 21 which measures the state of an object to be controlled in a process and outputs a first signal; an adjustment instrument 22 which adjusts the state of the object to be controlled; and a control instrument 23 which outputs a second signal for controlling the adjustment instrument 22 such that the first signal matches a target value of the object to be controlled. The determination device has: a signal conversion part 11 which converts the first signal and the second signal severally into wavelet conversion signals showing a relationship between time and frequency; and a determination part 12 which determines, in the case where a correlation degree between the wavelet transform signals severally converted by the signal conversion part 11 is deviated from a predetermined range of a correlation degree shown in a normal time of the control system 2, that the control system 2 has an abnormality.
申请公布号 JP2015225517(A) 申请公布日期 2015.12.14
申请号 JP20140110206 申请日期 2014.05.28
申请人 AZBIL CORP 发明人 NISHIMURA JUNJI;YAMASHITA KATSUHIRO;SASAOKA HIDEKI
分类号 G05B23/02 主分类号 G05B23/02
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