| 摘要 |
PROBLEM TO BE SOLVED: To provide a method capable of more accurately measuring the refraction index of a light scattering optical thin film causing light scattering inside.SOLUTION: A method for evaluating the optical characteristic of a light scattering optical thin film measures at least reflected light in a high refraction index light scattering layer, performs spectroscopic analysis using the measurement result of the reflected light and an expression (1-1), and thereby obtains the optical characteristic of the high refraction index light scattering layer. In the expression, reference character Rdenotes the reflection ratio of a light scattering layer 22, n denotes the refraction index of the light scattering layer 22, ndenotes the refraction index of a medium 30 bordering the light scattering layer 22, ndenotes the refraction index of a base material 21 bordering the light scattering layer 22, γ denotes the light scattering coefficient of the light scattering layer 22, d denotes the thickness of the light scattering layer 22, and λ denotes the wavelength of light used for measuring a reflection ratio. |
