发明名称 RAMAN SCATTERED LIGHT MEASUREMENT CHIP AND RAMAN SCATTERED LIGHT MEASUREMENT APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a chip for measuring Raman scattered light emitted from a sample with high sensitivity.SOLUTION: The Raman scattered light measurement chip has a measurement unit including: a base; a sample holder which is disposed facing to the base; and a sample receiver disposed between the base and the sample holder. A light wavelength selection area is formed on a plane of the base which is in contact with the sample receiver. The light wavelength selection area transmits illumination light irradiated to the sample in the sample receiver from the base side, and reflects Raman scattered light which is generated due to excitation light irradiated to the sample in the sample receiver from the sample holder side and is emitted from the sample. The sample holder has optical transparency in at least a part opposing to the light wavelength selection area.
申请公布号 JP2015225048(A) 申请公布日期 2015.12.14
申请号 JP20140111716 申请日期 2014.05.29
申请人 SONY CORP 发明人 DOWAKI MASARU;TATSUTA HIROKAZU;MATSUI ERIKO
分类号 G01N21/65 主分类号 G01N21/65
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