| 摘要 |
PROBLEM TO BE SOLVED: To provide a noise durability evaluation device and the like that can accurately extract an unextractable frequency affecting noise durability when employing an electromagnetic field analysis.SOLUTION: A noise durability evaluation device 100 comprises: an S-parameter measurement unit 120 that measures an S-parameter of a measured object (DUT) 300; an evaluation index calculation unit 130 that calculates a difference (evaluation index) of a predetermined S-parameter; an integration frequency spectrum calculation unit 140 that acquires an FFT frequency spectrum obtained by performing an FFT of a voltage waveform when noise obtained by an electromagnetic field analysis from an electromagnetic field analyzer (EMFA) 200 is input, and calculates an integration frequency spectrum by integration of the FFT frequency spectrum and the evaluation index; and a frequency extraction unit 150 that extracts a frequency indicative of a peak (a maximum value) of a voltage in the integration frequency spectrum as a frequency evaluating noise durability. |
