发明名称 |
MASK BLANK, MASK BLANK HAVING NEGATIVE TYPE RESIST FILM, PHASE SHIFT MASK, AND MANUFACTURING METHOD OF PATTERN FORMING BODY USING THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To provide a mask blank having an excellent transfer property in photo lithography, as well as high irradiation resistance against ArF excimer laser exposure light and cleaning resistance.SOLUTION: A mask blank 100 is used for manufacturing a half tone type phase shift mask employing ArF excimer laser exposure light. The mask blank 100 includes a transparent substrate and a light translucent film 102 formed on the transparent substrate 100 and configured by laminating a layer 102a including SiON(in which x and y satisfy 0<x<1, 0<y<1, and 0<x+y<1) and a layer 102b including SiN(in which z satisfies 0<z<1) in random order. The light translucent film 102 has light transmittance within a range of 3-40% in a wavelength of the ArF excimer laser exposure light, and film thickness within a range of 50-70 nm. |
申请公布号 |
JP2015225182(A) |
申请公布日期 |
2015.12.14 |
申请号 |
JP20140109481 |
申请日期 |
2014.05.27 |
申请人 |
DAINIPPON PRINTING CO LTD |
发明人 |
ADACHI TAKASHI;MIURA YOICHI;TAKAMIZAWA HIDEYOSHI;HAYANO KATSUYA;OKAWA YOHEI;WATANABE KOJI;TANI AYAKO |
分类号 |
G03F1/32;H01L21/027 |
主分类号 |
G03F1/32 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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