发明名称 SPECTRUM MEASUREMENT SYSTEM AND SPECTRAL LINE WIDTH MEASURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a spectrum measurement device and a measuring method thereof that enable a spectral line width to be measured with good reproducibility without requiring particular adjustment even if fluctuations occur in a polarization plane of a laser beam when light made incident passes through a delay optical fiber in the spectrum measurement device.SOLUTION: There is provided a spectrum measurement system for measuring a spectral line width from results of spectrum analysis of beat signals. In the spectrum measurement system, a polarization scrambler for randomizing polarization conditions of a passing-through laser beam is connected between an output side of a delay optical fiber and an input side of an optical directional coupler.
申请公布号 JP2015224952(A) 申请公布日期 2015.12.14
申请号 JP20140109654 申请日期 2014.05.28
申请人 OPTOHUB:KK 发明人 OIKAWA MASAHIRO;AOKI CHIKAO
分类号 G01J9/04 主分类号 G01J9/04
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